Scanning electron microscopes are a powerful tool in the field of scanning probe microscopy, and can be used for scanning surfaces or analyzing materials. These instruments use high-energy electrons to produce images and conduct analysis on samples that cannot be studied with other types of microscope. This blog post will discuss scanning electron microscope practical applications and how to use them!
Uses of Scanning Electron Microscopes
There are many scanning electron microscope applications that can benefit research, healthcare, and even technology. These microscopes offer a wide range of capabilities when working with different samples in the lab or for studying specimens from around the world.
Studying Surface Structures Using Scanning Electron Microscopy
One common scanning electron microscope application is examining surface structures on a small scale. Researchers use scanning electron microscopes to study the surface of materials as well as living cells and tissues, such as those found in plants or human skin samples. Scientists can find out more about how these surfaces work by studying them at different magnifications with scanning electron microscopes, which allow for viewing relatively large sample areas without having to slice them up for imaging.
Scanning Electron Microscopes and Nanotechnology
Another scanning electron microscope application is studying nanoscale materials, which are often used in the development of new technologies such as solar panels or semiconductor chips. This technology requires a scanning electron microscope with a fine probe that can detect even the smallest changes in a sample.
Studying Surface Topography in Biology and Medicine
The scanning electron microscope is also used to study the surfaces of biological samples, such as human cells or tissue. Researchers can use scanning electron microscopes to measure topographical features on specimens, which helps them learn more about how these structures work together in living systems. Scanning electron microscopes can also be used to detect defects in surfaces that might not otherwise be visible.