Ion Miller
Sample Preparation
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- High-quality sample preparation for SEM
- High efficiency flat milling
- Easy-to-use touch screen control (10″)
- Designed for tabletop
- Argon ion
sem Specifications
Model | Ion Miller | ||||||||||
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EFM-10 | Accelerating Voltage Beam Diameter Flat Angle Maximum Specimen Size Swing Angle Gas for Milling Vacuum Pump Dimension & Weight Power Supply Operating Pressure Compressed Air Humidity |
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ECM-10 | Accelerating Voltage Beam Diameter Milling Rate Maximum Specimen Size Stage Moving Range Gas for Milling Vacuum Pump Dimension & Weight Power Supply Operating Pressure Compressed Air Humidity |
photos & accessories
TABLETOP SEM SCANNING ELECTRON MICROSCOPE
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